Compositional Mapping by EPMA and µXRF
نویسندگان
چکیده
منابع مشابه
Compositional Mapping by EPMA and μXRF
We present methods combining backscattered-electron (BSE) mosaic imaging, quantitative spot-mode electron-probe microanalysis (EPMA), and quantitative compositional mapping by EPMA and micro-xray fluorescence (μXRF) to provide a framework for detailed analysis of terrestrial and lunar samples. BSE imaging provides a base map for the characterization of samples by EPMA. Recent developments in im...
متن کاملElemental Mapping in Slices of Human Brain by Sr-μxrf
Cognitive deficits are repeatedly described with Pb exposure, but little is known about the distribution of lead in brain. To determine the local distribution of lead (Pb) and other trace elements, X-Ray Fluorescence Spectroscopy (XRF) measurements have been performed, using a microbeam setup and highest flux synchrotron radiation. Experiments have been carried out at ID-22, ESRF, Grenoble, Fra...
متن کاملCompositional mapping of semiconductor structures by friction force microscopy
Topographic and chemical mapping of materials at high resolution define the goals of a microscope. Force microscopy can provide methods for simultaneous topography and chemical characterization of materials. Here we describe the use of the atomic force microscope to map chemical variations of semiconductor samples. Chemical maps of semiconductor InP/InGaAs alloys have been determined with 3 nm ...
متن کاملElectron Probe Microanalysis (EPMA)
An electron microprobe is an electron microscope designed for the non-destructive x-ray microanalysis and imaging of solid materials. It is essentially a hybrid instrument combining the capabilities of both the scanning electron microscope (SEM) and an x-ray fluorescence spectrometer (XRF), with the added features of fine-spot focusing (~ 1 micrometer), optical microscope imaging, and precision...
متن کاملNew method of the chemical state imaging by EPMA-EXEFS.
A novel two dimensional imaging technique of the chemical bonding state was developed by combining the extended X-ray emission fine structure method with an electron probe X-ray microanalyzer mapping technology. With this method, chemical state images of some aluminum standard samples were obtained. It was confirmed that the obtained images provide correct information of chemical states.
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Microscopy and Microanalysis
سال: 2014
ISSN: 1431-9276,1435-8115
DOI: 10.1017/s1431927614005273